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    <SEQUENTIAL>
      <record key="001" att1="001" value="LIB90246050X" att2="LIB90246050X">001   LIB90246050X</record>
      <field key="010" subkey="">LIB902460109</field>
      <field key="037" subkey="x">englisch</field>
      <field key="050" subkey="x">Aufsatz, Sammelband</field>
      <field key="090" subkey="">004</field>
      <field key="100" subkey="">bossen, d.c.</field>
      <field key="104" subkey="a">ostapko, d.l.</field>
      <field key="108" subkey="a">patel, a.m.</field>
      <field key="331" subkey="">optimum test patterns for parity networks</field>
      <field key="525" subkey="">reprinted from: fall joint computer conference, 1970</field>
      <field key="544" subkey="n">5431-A;4</field>
      <field key="596" subkey="a">83 - 92</field>
    </SEQUENTIAL>
  </section>